CMOS performance enhancement using localized voids and extended defects

ABSTRACT

The speed of CMOS circuits is improved by imposing a longitudinal tensile stress on the NFETs and a longitudinal compressive stress on the PFETs, by implanting in the sources and drains of the NFETs ions from the eighth column of the periodic table and hydrogen and implanting in the sources and drains of the PFETs ions from the fourth and sixth columns of the periodic table.

BACKGROUND OF INVENTION

This invention relates to CMOS integrated circuits, and particularly tothe fabrication of N-type and P-type field effect transistors (NFETs andPFETs) for improved device performance.

It is known that mechanical stress can affect the performance ofsemiconductor devices. Specifically, stress affects the mobility ofcarriers in semiconductors. Individual stress tensor components maycause different effects on the device behavior of PFETs and NFETsrespectively. A uniaxial tensile stress, longitudinally applied (thatis, in the same direction as the channel current), enhances performanceof an NFET but degrades the performance of a PFET. A longitudinallyapplied compressive stress reverses the effect; it enhances performanceof a PFET but degrades that of an NFET. However, a transversely applieduniaxial tensile stress (normal to the direction of the channel current)enhances performance of both NFETs and PFETs simultaneously.

A biaxial stress will improve the NFET to a greater degree than auniaxial stress, but will not improve the PFET because the two stresscomponents have effects that cancel in the PFET. Previous workers havefound that when an in-plane biaxial tensile stress is applied, NFETdevice performance improves about twofold compared to performance underuniaxial tensile stress, while PFET performance is unchanged.

In order to maximize the performance of both NFET and PFET devicesthrough the application of mechanical stress, the stress componentsshould be applied differently for the two types of devices. Previousattempts to use mechanical stress for device performance enhancementhave not improved both NFETs and PFETs simultaneously order to increasethe speed of CMOS circuits, there is a need for a method for providingtension in both the longitudinal and transverse directions (with respectto channel current) for the NFET, while at the same time providingcompression in the longitudinal direction and tension in the transversedirection for the PFET.

SUMMARY OF INVENTION

The present invention addresses the above-described need by providing amethod of increasing the speed of CMOS circuits by imposing differentlongitudinal stresses on NFET and PFET devices. In accordance with thepresent invention, this is done by forming localized extended defects inthe semiconductor material to introduce a longitudinal tensile stressfor the NFETs while at the same time applying a longitudinal compressivestress for the PFETs.

A feature of the invention is the creation of voids/bubbles in sourcesand drains of NFETs to impose tensile stress in the body of the NFETsand the creation of dislocation loops or precipitates in sources anddrains of PFETs to impose compressive stress in the body of PFETs.

Another feature of the invention is the implantation of elements fromthe fourth and sixth column of the periodic table in PFETs.

Another feature of the invention is the implantation of noble gases fromthe eighth column of the periodic table (and hydrogen) in NFETs.

A noteworthy advantage of the present invention is that performance ofboth NFET and PFET devices is improved simultaneously. It will also beappreciated that the process of the invention may readily be integratedinto circuit fabrication processes known in the art. In addition, thepresent invention may be practiced in the fabrication of structures onbulk, SOI or strained Si substrates, and in both logic and memorydevices. Furthermore, the present invention offers the advantage ofsignificant device performance improvement at low cost.

BRIEF DESCRIPTION OF DRAWINGS

FIGS. 1A and 1B illustrate the implantation of defects that provideappropriate stress in both NFETs and PFETs, respectively.

FIGS. 2A and 2B illustrate an NFET and a PFET structure, respectively,on which the method of the present invention is performed.

FIG. 3 illustrates an implant process to cause defects in source anddrain regions of an NFET.

FIG. 4 illustrates a source/drain (S/D) implant process for an NFET.

FIG. 5 illustrates an implant process to cause defects in source anddrain regions of a PFET.

FIG. 6 illustrates a source/drain (S/D) implant process for a PFET.

FIGS. 7A and 7B illustrate defects in an NFET and a PFET, respectively,after an anneal is performed, showing completion of a process inaccordance with a first embodiment of the invention.

FIGS. 8A and 8B illustrate NFET and PFET devices, respectively, withimplanted defects after removing temporary spacers, in accordance with asecond embodiment of the invention.

DETAILED DESCRIPTION

Cross sections of NFETs and PFFTs modified according to the inventionare illustrated in FIGS. 1A and 1B, respectively. In FIG. 1A, an NFEThas been formed in silicon substrate 10 with gate 110 positioned overgate dielectric 111 and transistor body 115 and bracketed byconventional spacers 112. Isolation trenches 22 isolate the transistorfrom other circuit elements.

Spacers 112 are formed as part of a conventional method of forminglow-doped source and drain extensions and/or halo implants. Thesepreliminary steps, including threshold implants, well implants and thelike, will be referred to as preparing the substrate. FIG. 1B shows acorresponding cross section for a PFET.

The vertical arrows in FIGS. 1A and 1B schematically illustrate an ionimplantation process that creates voids, bubble or vacancy defects 20(referred to collectively as voids) in the source and drain regions ofthe NFET, and another implant that creates interstitial defects 30 suchas dislocation loops or precipitates (referred to collectively asextrinsic extended defects) in the source and drain regions of the PFETthat cause intrinsic compressive stresses in the PFET. The horizontalarrows indicate tensile stress on the gate channel region of the NFET inFIG. 1A, and compressive stress on the gate channel region of the PFETin FIG. 1B. After each of these implant processes, annealing may beperformed to cause the extended defects to grow in the substrate.

The process of implantation to form defects may be performed eitherbefore or after halo implant, as detailed below.

First Embodiment: Defect Implant after Halo Implant

In the first embodiment of the invention, the implants which produceextended defects and cause the desired stress are performed afterpreparing the substrate, and in particular after forming theextension/halo regions. A substrate having both NFETs and PFETs (shownin FIGS. 2A and 2B respectively) is prepared, including steps of welldoping and formation of isolation structures. The NFETs and PFETs areprocessed to form gates 110 with gate dielectric 111, and extension/halodoping (not shown in FIGS. 2A and 2B) is then performed. Spacers 113,usually of silicon nitride, are formed on the sides of the gatestructures. The techniques and sequence of the above-mentioned steps areknown in the art.

One polarity of transistor (e.g. the PFET) is blocked by a convenientmaterial such as photoresist and/or an antireflective coating (ARC)stack, and the other polarity is implanted as shown schematically inFIG. 3. In the case of the NFET implant, the implant species ispreferably a noble gas (that is, He, Ne, Ar, Kr or Xe from the eighthcolumn of the periodic table) or hydrogen, in order to have no chemicaleffect on the other dopants for the source and drain. The implant energyis preferably chosen such, that the voids stay within the source anddrain (S/D) regions (that is, above the S/D junctions), therebyminimizing leakage to the bulk silicon below. The implant dose ispreferably in the range 5×10¹⁴/cm² to 5×10¹⁶/cm². The magnitude of theimplant energy may range from 1 keV to several hundred keV, depending onthe implant species and the desired implant depth. (If the invention isimplemented in an SOI wafer, this consideration is removed and theimplant depth is not restricted.)

After the implant, an optional anneal may be performed to adjust thesize of the voids, and hence the amount of stress in the NFET channel.It should be noted that this anneal step requires an additional maskingstep.

The S/D implant for the NFET is then performed, typically using either Por As (as shown schematically in FIG. 4) to form S/D regions 114. Thephotoresist coating on the PFET is removed, and the NFET is blocked asshown in FIG. 5. An implant process is then performed which will formdislocation loops in the PFET after annealing. This PFET implant isperformed with a dose of Si or Ge (a species that is electrically andchemically neutral), as shown in FIG. 5, or more generally with anelement from the fourth or sixth column of the periodic table. Theimplant dose is preferably in the range 2×10¹⁴/cm² to 2×10¹⁶/cm². Theimplant energy may vary from 5 keV to several hundred keV. As with theNFETs, the implant energy is chosen such that the extended defectscreated during the anneal stay within the range of the S/D and also thatthe amorphous region created by the implant extends to a greater depththan the amorphous region caused by the S/D implant.

After the implant, an optional anneal may be performed to adjust thesize of the dislocation loops, and hence the amount of stress in thePFET channel. It should be noted that this anneal step requires anadditional masking step.

The S/D implant for the PFET is then performed, typically using B and/orBF₂ (as shown schematically in FIG. 6), to form S/D regions 114′. Thecoating on the NFET is removed, and an anneal is performed to createbubbles (more generally, voids) 20 in the NFET structure (see FIG. 7A),and to create dislocation loops (more generally, extended extrinsicdefects) 30 in the PFET structure (see FIG. 7B). As noted above, theanneal process conditions should be chosen so that the boundary betweenthe S/D regions and the bulk material of the substrate 10 is deeper thanthe location of the defects (that is, substantially all of the defectsremain above the S/D junctions).

Second Embodiment: Disposable Spacer Process

The second embodiment of the invention uses a disposable spacer process.In this embodiment, the implants for creating defects and for formingthe S/D regions are performed before the halo and extension implants, sothat the extent and distribution of the halo and extension dopants willnot be affected by the optional bubble/loop size adjustment anneals.

Referring now to FIGS. 2A and 2B, there are shown sample transistors(NFET and PFET respectively) at a stage before the halo implants. Gates110 are formed over gate dielectric 111 and dummy spacers 113 are formedon both the NFET and PFET structures.

Implant processes to cause defects and to form the S/D regions are thenperformed as in the first embodiment (see FIGS. 3-6). FIG. 3 shows theNFET bubble formation implant with the PFFT blocked; an optional annealmay be performed at this point to adjust the size of the bubbles andhence the amount of stress in the NFET channel. FIG. 4 shows the NFETS/D implant forming S/D regions 114. The bubble implant is performedwith a noble gas or hydrogen as the implant species and the S/D implantis typically performed with P or As as the implant species. The dosesand energies are the same as in the first embodiment. Similarly, FIGS. 5and 6 show the counterpart implants to form dislocation loops and toform S/D regions 114′ in the PFET, with the NFET blocked. An optionalanneal may be performed after the implant shown in FIG. 5, to adjust thesize of the dislocation loops and hence the amount of stress int thePFET channel. As noted above, each optional annealing process requiresan additional mask.

After the PFET S/D implant (FIG. 6), annealing is performed to cause theextended defects to grow. FIGS. 7A and 7B show the NFET and PFET devicesafter the anneals, with bubbles (more generally, voids) 20 in the NFETand dislocation loops (more generally, extended extrinsic defects) 30 inthe PFET.

In this embodiment, the disposable spacers 113 are then removed. FIGS.8A and 8B show NFET and PFET devices, respectively, after spacers 113are removed and halos 117, 117′ and extension areas 116, 116′ areformed. Other spacers may be formed in order to provide contactisolation, if desired.

Typical sizes of the extended defects range from about 200 Å to about700 Å, with areal densities from about 5×10⁹/cm² to about 1×10¹¹/cm².The number of point defects in these extended defects (bubbles/voids 20,interstitial loops 30) is believed to be approximately constant throughthe annealing cycle, and is in accordance with the implant dose.

The stress caused by growth of dislocation loops after annealing may beestimated by assuming that defect growth distributes strain over thethickness of the regrown silicon. For example, if this Si thickness isabout 500 Å, and the Si implant dose is typically 1×10¹⁵/cm², a typicalloop density is 1×10¹⁰/cm² with a radius of 300 Å; the expectedlongitudinal strain is about 0.3%. This is enough to cause stresseffects on the band gap and carrier mobility in the device. Largerstresses may be obtained by using higher implant doses.

In the above-described embodiments, implants for NFETs are shown asperformed before the corresponding implants for PFETs. The two types oftransistors may be processed in reverse order if desired.

Those skilled in the art will appreciate that the method according tothe invention is suited to silicon, silicon-geranium alloy, bulk wafersand SOI wafers. Those skilled in the art will also appreciate that theanneals are preferably performed separately, but may be performedsimultaneously if the cost saving is deemed to be sufficient.

While the invention has been described in terms of preferredembodiments, those skilled in the art will recognize that the inventioncan be practiced in various versions within the spirit and scope of thefollowing claims.

1-17. (cancelled)
 18. An integrated circuit formed in a semiconductorsubstrate, comprising: a set of PFET and NFET transistors in which atleast some of said NFET and PFET transistors have their sources anddrains implanted with a substance that produces a stress on the bodiesthereof, and in which said NFET transistors have an implant thatproduces a tensile stress in the bodies of said NFETs and in which saidPFET transistors have an implant that produces a compressive stress inthe bodies of said PFETs.
 19. An integrated circuit according to claim18, in which said NFET transistors have sources and drains implantedwith an element selected from the group consisting of elements from theeighth column of the periodic table and hydrogen.
 20. An integratedcircuit according to claim 18, in which said PFET transistors havesources and drains implanted with an element selected from the groupconsisting of elements from the fourth and sixth columns of the periodictable.